Application of Total-Reflection X-ray Fluorescence Spectrometry to Elemental Toner Analysis

Application of total reflection X-ray fluorescence spectrometry to small glass fragments.

Total reflection X-ray fluorescence spectrometry (TXRF) has been applied for trace elemental analysis of small glass fragments. A small glass sample (a fragment with weight less than 0.5 mg) was decomposed by 100 microg of HF/HNO3 acid; the material was condensed to 10 microl and was dried on a Si wafer. Since the size of the dried residue on the Si wafer was less than 1 cm in diameter, an inci...

Synchrotron radiation-induced total reflection X-ray fluorescence analysis

Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional informatio...

Determination of carbon in natural freshwater biofilms with total reflection X-ray fluorescence spectrometry

Determination of halide impurities in ionic liquids by total reflection X-ray fluorescence spectrometry.

The determination and quantification of halide impurities in ionic liquids is highly important because halide ions can significantly influence the chemical and physical properties of ionic liquids. The use of impure ionic liquids in fundamental studies on solvent extraction or catalytic reactions can lead to incorrect experimental data. The detection of halide ions in solution by total reflecti...

Total Reflection X-ray Fluorescence Spectrometry for Characterization of Nuclear Materials

Total reflection X-Ray Fluorescence (TXRF) is a comparatively new technique of material characterization and trace element analysis. It is an advanced variant of Energy Dispersive X-ray Fluorescence (EDXRF) and is based on the principle of total reflection of X-rays when these radiations fall on a flat smooth surface at a grazing angle less than the critical angle of the sample support. The cri...